Oxidative stress and factors of lipid risk in the chronic refection of renal transplant

Authors

  • Ana Aurora Rodríguez Albanés FACULTAD DE CIENCIAS MEDICAS HOSPITAL DOCENTE “HERMANOS AMEJEIRA”
  • Eva Barrano Hernández FACULTAD DE CIENCIAS MEDICAS HOSPITAL DOCENTE “HERMANOS AMEJEIRA”

Keywords:

TRANSPLANTACIÓN DEL RIÑÓN, N TA TRANSPANTACIÓN DEL RIÑÓN, ESTRÉS OXIDATIVO, HUMANO-ADULTO

Abstract

The chronic rejection is the most important cause of loss of renal implnat in the first year of the postransplant.Several inmunologic and not inmunologic factors are associated to the gradual deterioration of the implanted organs 30 patients of renal transplant were studied from October 1994 to October 1997,patients werw about 41,90,10,66 years old(and halfsd) of them M:F 21 :9 B:N 15:15 with the objective of identifying the factors of lipid risk that strike in the progresión of the long term of renal damage ,companing them with a group of renal chronic(n=19,creatinina)less than 500 umo/l and a group of save control (N=23).
It was measured irritially in blood (heamtocri)(creatinina)(colesterol)(triglicéridos).
The clinical diagnosis(hispatologic) of RC was confirmed in 6 months in 4 patients ,in a year 3 and to the second year in 7 ,at the moment 5 died of the total and two evolve in dialitic meted.It was conalated with ultrasongraphics studies through the Doppler color of the kidney transplant in 11 receivers(78,5 %) means of o,87(R:0.70 0.89)and pulsativity of 1:89 (R.150 2-43) all the patients with RC were presented more than presented more than a FRL in associated with the RC what evidence that the hiperlipidemy plays a preponderant list in the progresión of the renal illness and the disfunction of the long term attack.

Downloads

Download data is not yet available.

How to Cite

1.
Rodríguez Albanés AA, Barrano Hernández E. Oxidative stress and factors of lipid risk in the chronic refection of renal transplant. Rev Méd Electrón [Internet]. 2014 Feb. 11 [cited 2025 Apr. 24];24(2):90-7. Available from: https://revmedicaelectronica.sld.cu/index.php/rme/article/view/38

Issue

Section

Research article